ddsf:public:applications:simulation_and_test
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ddsf:public:applications:simulation_and_test [2021/07/14 15:55] murphy ↷ Links adapted because of a move operation |
ddsf:public:applications:simulation_and_test [2021/07/14 15:56] (current) murphy ↷ Links adapted because of a move operation |
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| There is an increasing demand to make Modeling & Simulation and Test environments | There is an increasing demand to make Modeling & Simulation and Test environments | ||
| - | more realistic and sophisticated. [[ddsf:public:guidebook:06_append:glossary:d:data_distribution_service_dds]] provides the high [[ddsf:private:guidebook:06_append:glossary:t:thruput|throughput]], low [[ddsf:public:guidebook:06_append:glossary:l:latency|latency]], | + | more realistic and sophisticated. [[ddsf:public:guidebook:06_append:glossary:d:data_distribution_service_dds]] provides the high [[ddsf:public:guidebook:06_append:glossary:t:thruput|throughput]], low [[ddsf:public:guidebook:06_append:glossary:l:latency|latency]], |
| real-time data connectivity that is needed to support an increasingly varied and | real-time data connectivity that is needed to support an increasingly varied and | ||
| wide range of complex scenarios. DDS enables [[ddsf:public:guidebook:06_append:glossary:r:reusability|reusability]] and [[ddsf:public:guidebook:06_append:glossary:i:interoperability|interoperability]] | wide range of complex scenarios. DDS enables [[ddsf:public:guidebook:06_append:glossary:r:reusability|reusability]] and [[ddsf:public:guidebook:06_append:glossary:i:interoperability|interoperability]] | ||
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| [[ ddsf:public:applications:start | Return to Applications ]] | [[ ddsf:public:applications:start | Return to Applications ]] | ||
| - | Test and Measurement focuses on dedicated equipment for analysis, [[ddsf:private:guidebook:06_append:glossary:v:validation|validation]], | + | Test and Measurement focuses on dedicated equipment for analysis, [[ddsf:public:guidebook:06_append:glossary:v:validation|validation]], |
| - | and [[ddsf:private:guidebook:06_append:glossary:v:vendorlockin|verification]] of electronic device measurement, mechanical systems, and end | + | and [[ddsf:public:guidebook:06_append:glossary:v:vendorlockin|verification]] of electronic device measurement, mechanical systems, and end |
| products. As complexity of measurement tasks increases, providers are required | products. As complexity of measurement tasks increases, providers are required | ||
| to develop innovative products with higher accuracy and resolution and flexible | to develop innovative products with higher accuracy and resolution and flexible | ||
ddsf/public/applications/simulation_and_test.1626292501.txt.gz · Last modified: 2021/07/14 15:55 by murphy
